SiO2/Si interfaces on high-index surfaces: Re-evaluation of trap densities and characterization of bonding structures

Published 2011 View Full Article

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Title
SiO2/Si interfaces on high-index surfaces: Re-evaluation of trap densities and characterization of bonding structures
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 98, Issue 9, Pages 092906
Publisher
AIP Publishing
Online
2011-03-05
DOI
10.1063/1.3561741
References
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