SiO2/Si interfaces on high-index surfaces: Re-evaluation of trap densities and characterization of bonding structures

标题
SiO2/Si interfaces on high-index surfaces: Re-evaluation of trap densities and characterization of bonding structures
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 98, Issue 9, Pages 092906
出版商
AIP Publishing
发表日期
2011-03-05
DOI
10.1063/1.3561741

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