High brightness InGaN-based yellow light-emitting diodes with strain modulation layers grown on Si substrate

Title
High brightness InGaN-based yellow light-emitting diodes with strain modulation layers grown on Si substrate
Authors
Keywords
External Quantum Efficiency, Indium Content, Lead Chip, Efficiency Droop, High Indium Content
Journal
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume 114, Issue 4, Pages 1049-1053
Publisher
Springer Nature
Online
2014-02-05
DOI
10.1007/s00339-014-8283-9

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