Quantifying the quality of femtosecond laser ablation of graphene

Title
Quantifying the quality of femtosecond laser ablation of graphene
Authors
Keywords
Graphene Oxide, Scanning Electron Microscope Image, Ablation Threshold, Bessel Beam, Ablate Sample
Journal
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume 116, Issue 2, Pages 555-560
Publisher
Springer Nature
Online
2014-08-20
DOI
10.1007/s00339-014-8522-0

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