Hopping Intermittent Contact-Scanning Electrochemical Microscopy (HIC-SECM): Visualizing Interfacial Reactions and Fluxes from Surfaces to Bulk Solution

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Title
Hopping Intermittent Contact-Scanning Electrochemical Microscopy (HIC-SECM): Visualizing Interfacial Reactions and Fluxes from Surfaces to Bulk Solution
Authors
Keywords
-
Journal
ANALYTICAL CHEMISTRY
Volume 85, Issue 5, Pages 2937-2944
Publisher
American Chemical Society (ACS)
Online
2013-02-04
DOI
10.1021/ac303642p

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