Hopping Intermittent Contact-Scanning Electrochemical Microscopy (HIC-SECM): Visualizing Interfacial Reactions and Fluxes from Surfaces to Bulk Solution

标题
Hopping Intermittent Contact-Scanning Electrochemical Microscopy (HIC-SECM): Visualizing Interfacial Reactions and Fluxes from Surfaces to Bulk Solution
作者
关键词
-
出版物
ANALYTICAL CHEMISTRY
Volume 85, Issue 5, Pages 2937-2944
出版商
American Chemical Society (ACS)
发表日期
2013-02-04
DOI
10.1021/ac303642p

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