Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions

标题
Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions
作者
关键词
-
出版物
ANALYTICAL CHEMISTRY
Volume 82, Issue 1, Pages 98-105
出版商
American Chemical Society (ACS)
发表日期
2009-12-04
DOI
10.1021/ac901045q

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