The role of the auxiliary atomic ion beam in C60+–Ar+co-sputtering

Effect of Fabrication Parameters on Three-Dimensional Nanostructures of Bulk Heterojunctions Imaged by High-Resolution Scanning ToF-SIMS

(2010) Bang-Ying Yu et al.   ACS Nano

Effect of Fabrication Parameters on Three-Dimensional Nanostructures and Device Efficiency of Polymer Light-Emitting Diodes

(2010) Bang-Ying Yu et al.   ACS Nano

Sputter-induced chemical transformation in oxoanions by combination of C60+ and Ar+ ion beams analyzed with X-ray photoelectron spectrometry

(2009) Yu-Chin Lin et al.   ANALYST

Molecular sputter depth profiling using carbon cluster beams

(2009) Andreas Wucher et al.   ANALYTICAL AND BIOANALYTICAL CHEMISTRY

Three-Dimensional Nanoscale Imaging of Polymer Bulk-Heterojunction by Scanning Electrical Potential Microscopy and C60+Cluster Ion Slicing

(2009) Bang-Ying Yu et al.   ANALYTICAL CHEMISTRY

Molecular Depth Profiling of Sucrose Films: A Comparative Study of C60n+Ions and Traditional Cs+and O2+Ions

(2009) Zihua Zhu et al.   ANALYTICAL CHEMISTRY

Improvement of depth resolution in XPS analysis of fluorinated layer using C60 ion sputtering

(2009) Takuya Nobuta et al.   APPLIED SURFACE SCIENCE

Tuning Work Function of Noble Metals As Promising Cathodes in Organic Electronic Devices

(2009) Fenghong Li et al.   CHEMISTRY OF MATERIALS

Effect of fabrication process on the microstructure and the efficiency of organic light-emitting diode

(2009) Wei-Chun Lin et al.   ORGANIC ELECTRONICS

Migration of small molecules during the degradation of organic light-emitting diodes

(2009) Wei-Chun Lin et al.   ORGANIC ELECTRONICS

Depth Profiling of Organic Films with X-ray Photoelectron Spectroscopy Using C60+and Ar+Co-Sputtering

(2008) Bang-Ying Yu et al.   ANALYTICAL CHEMISTRY

Sputter damage in Si (001) surface by combination of C60+ and Ar+ ion beams

(2008) Bang-Ying Yu et al.   APPLIED SURFACE SCIENCE

X-ray Photoelectron Spectrometry Depth Profiling of Organic Thin Films Using C60Sputtering

(2007) Ying-Yu Chen et al.   ANALYTICAL CHEMISTRY