Journal
ACS NANO
Volume 4, Issue 5, Pages 2547-2554Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nn901593c
Keywords
cluster ion sputtering; force modulation microscopy; nanostructure; light-emitting diode; organic electronics
Categories
Funding
- Academia Sinica
- Ministry of Economic Affairs
- Taiwan National Science Council [98-2113-M-001-012-MY2, 98-2120-M-002-005]
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By using 10 kV C-60(+) and 200 V Ar+ ion co-sputtering, a crater was created on the light-emitting layer of phosphorescent polymer light-emitting diodes, which consisted of a poly(9-vinyl carbazole) (PVK) host doped with a 24 wt % iridium(III)bis[(4,6-difluorophenyl)pyridinato-N,C-2] (Flrpic) guest. A force modulation microscope (FMM) was used to analyze the nanostructure at the flat slope near the edge of the crater. The three-dimensional distribution of PVK and Flrpic was determined based on the difference in their mechanical properties from FMM. It was found that significant phase separation occurred when the luminance layer was spin coated at 30 degrees C, and the phase-separated nanostructure provides a route for electron transportation using the guest-enriched phase. This does not generate excitons on the host, which would produce photons less effectively. On the other hand, a more homogeneous distribution of molecules was observed when the layer was spin coated at 60 degrees C. As a result, a 30% enhancement in device performance was observed.
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