Three-Dimensional Kelvin Probe Microscopy for Characterizing In-Plane Piezoelectric Potential of Laterally Deflected ZnO Micro-/Nanowires
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Title
Three-Dimensional Kelvin Probe Microscopy for Characterizing In-Plane Piezoelectric Potential of Laterally Deflected ZnO Micro-/Nanowires
Authors
Keywords
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Journal
ADVANCED FUNCTIONAL MATERIALS
Volume 22, Issue 3, Pages 652-660
Publisher
Wiley
Online
2011-12-05
DOI
10.1002/adfm.201102325
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