Real versus Measured Surface Potentials in Scanning Kelvin Probe Microscopy

Title
Real versus Measured Surface Potentials in Scanning Kelvin Probe Microscopy
Authors
Keywords
-
Journal
ACS Nano
Volume 2, Issue 4, Pages 622-626
Publisher
American Chemical Society (ACS)
Online
2008-03-20
DOI
10.1021/nn700190t

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