Three-Dimensional Kelvin Probe Microscopy for Characterizing In-Plane Piezoelectric Potential of Laterally Deflected ZnO Micro-/Nanowires

标题
Three-Dimensional Kelvin Probe Microscopy for Characterizing In-Plane Piezoelectric Potential of Laterally Deflected ZnO Micro-/Nanowires
作者
关键词
-
出版物
ADVANCED FUNCTIONAL MATERIALS
Volume 22, Issue 3, Pages 652-660
出版商
Wiley
发表日期
2011-12-05
DOI
10.1002/adfm.201102325

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