Improved XPS analysis by visual inspection of the survey spectrum

Film thickness measurement and contamination layer correction for quantitative XPS

(2016) J. Walton et al.   SURFACE AND INTERFACE ANALYSIS

Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm

(2015) H. Shinotsuka et al.   SURFACE AND INTERFACE ANALYSIS

Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range

(2010) S. Tanuma et al.   SURFACE AND INTERFACE ANALYSIS

Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging

(2009) Sven Tougaard   JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

Practical expressions for the mean escape depth, the information depth, and the effective attenuation length in Auger-electron spectroscopy and x-ray photoelectron spectroscopy

(2009) A. Jablonski et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A

Evaluation of uncertainties in X-ray photoelectron spectroscopy intensities associated with different methods and procedures for background subtraction. I. Spectra for monochromatic Al X-ray

(2009) C. J. Powell et al.   SURFACE AND INTERFACE ANALYSIS

Modeling of complex surface structures for ARXPS

(2008) S. Oswald et al.   SURFACE AND INTERFACE ANALYSIS

Noise reduction procedures applied to XPS imaging of depth distribution of atoms on the nanoscale

(2008) Shaaker Hajati et al.   SURFACE SCIENCE