Film thickness measurement and contamination layer correction for quantitative XPS

Traceable thickness determination of organic nanolayers by X-ray reflectometry

(2014) Jan Wernecke et al.   SURFACE AND INTERFACE ANALYSIS

Validity of automated x-ray photoelectron spectroscopy algorithm to determine the amount of substance and the depth distribution of atoms

(2013) Sven Tougaard   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A

Simple universal curve for the energy-dependent electron attenuation length for all materials

(2012) M. P. Seah   SURFACE AND INTERFACE ANALYSIS

An accurate and simple universal curve for the energy-dependent electron inelastic mean free path

(2011) M. P. Seah   SURFACE AND INTERFACE ANALYSIS

XPS for non-destructive depth profiling and 3D imaging of surface nanostructures

(2010) Shaaker Hajati et al.   ANALYTICAL AND BIOANALYTICAL CHEMISTRY

An application for near-real-time analysis of XPS data

(2010) A. S. Lea et al.   SURFACE AND INTERFACE ANALYSIS

Attenuation lengths in organic materials

(2010) M. P. Seah et al.   SURFACE AND INTERFACE ANALYSIS

Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns

(2010) F. de la Peña et al.   SURFACE SCIENCE

Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging

(2009) Sven Tougaard   JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

Angular accuracy and the comparison of two methods for determining the surface normal in a Kratos Axis Ultra X-ray photoelectron spectrometer

(2009) M. P. Seah et al.   SURFACE AND INTERFACE ANALYSIS

Noise reduction procedures applied to XPS imaging of depth distribution of atoms on the nanoscale

(2008) Shaaker Hajati et al.   SURFACE SCIENCE