Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging

Published 2009 View Full Article

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Title
Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging
Authors
Keywords
-
Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 178-179, Issue -, Pages 128-153
Publisher
Elsevier BV
Online
2009-08-27
DOI
10.1016/j.elspec.2009.08.005

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