Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials
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Title
Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials
Authors
Keywords
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Journal
SCIENCE
Volume 359, Issue 6376, Pages 675-679
Publisher
American Association for the Advancement of Science (AAAS)
Online
2018-01-19
DOI
10.1126/science.aao0865
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