Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials

标题
Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials
作者
关键词
-
出版物
SCIENCE
Volume 359, Issue 6376, Pages 675-679
出版商
American Association for the Advancement of Science (AAAS)
发表日期
2018-01-19
DOI
10.1126/science.aao0865

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