Mechanisms of radiation damage in beam-sensitive specimens, for TEM accelerating voltages between 10 and 300 kV

Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene

(2012) Jannik C. Meyer et al.   PHYSICAL REVIEW LETTERS

Chemical Distribution and Bonding of Lithium in Intercalated Graphite: Identification with Optimized Electron Energy Loss Spectroscopy

(2011) Feng Wang et al.   ACS Nano

Delocalized radiation damage in polymers

(2011) R.F. Egerton et al.   MICRON

Transmission electron microscopy at 20kV for imaging and spectroscopy

(2011) U. Kaiser et al.   ULTRAMICROSCOPY

40keV atomic resolution TEM

(2011) David C. Bell et al.   ULTRAMICROSCOPY

Electron knock-on damage in hexagonal boron nitride monolayers

(2010) J. Kotakoski et al.   PHYSICAL REVIEW B

In situ TEM of radiation effects in complex ceramics

(2009) Jie Lian et al.   MICROSCOPY RESEARCH AND TECHNIQUE

Atomic-resolution imaging of lithium inAl3Liprecipitates

(2009) M. D. Rossell et al.   PHYSICAL REVIEW B

Basic questions related to electron-induced sputtering in the TEM

(2009) R.F. Egerton et al.   ULTRAMICROSCOPY