Rapid prediction of deoxynivalenol contamination in wheat bran by MOS-based electronic nose and characterization of the relevant pattern of volatile compounds

Title
Rapid prediction of deoxynivalenol contamination in wheat bran by MOS-based electronic nose and characterization of the relevant pattern of volatile compounds
Authors
Keywords
-
Journal
Publisher
Wiley
Online
2018-03-26
DOI
10.1002/jsfa.9028

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