Investigation of gate induced noise in E-mode GaN MOS-HEMT and its effect on noise parameters

Effects of trap density on drain current LFN and its model development for E-mode GaN MOS-HEMT

(2017) D.K. Panda et al.   SUPERLATTICES AND MICROSTRUCTURES

Low Frequency Noise and Gate Bias Instability in Normally OFF AlGaN/GaN HEMTs

(2016) Felice Crupi et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Modeling of Forward Gate Leakage Current in MOSHEMT Using Trap-Assisted Tunneling and Poole–Frenkel Emission

(2016) Raghunandan Swain et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

GaN HEMT Noise Model Based on Electromagnetic Simulations

(2015) Andrea Nalli et al.   IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES

Wave approach for noise modeling of gallium nitride high electron-mobility transistors

(2015) Vladica Đorđević et al.   INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS

GaN HEMT noise modeling based on 50-Ω noise factor

(2015) Giovanni Crupi et al.   MICROWAVE AND OPTICAL TECHNOLOGY LETTERS

A Compact Model for Generic MIS-HEMTs Based on the Unified 2DEG Density Expression

(2014) Junbin Zhang et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Polynomial noise modeling of silicon-based GaN HEMTs

(2013) Sergio Colangeli et al.   INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS

AlGaN/GaN-based HEMT on SiC substrate for microwave characteristics using different passivation layers

(2012) T R LENKA et al.   PRAMANA-JOURNAL OF PHYSICS

Temperature-Dependent Microwave Noise Characteristics in ALD $\hbox{Al}_{2}\hbox{O}_{3}$/AlGaN/GaN MISHEMTs on Silicon Substrate

(2011) Z. H. Liu et al.   IEEE ELECTRON DEVICE LETTERS

Analytical Modeling of High-Frequency Noise Including Temperature Effects in GaN HEMTs on High-Resistivity Si Substrates

(2010) Zhi Hong Liu et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

A new analytical high frequency noise parameter model for AlGaN/GaN HEMT

(2010) Xiaoxu Cheng et al.   SOLID-STATE ELECTRONICS

Compact Channel Noise Models for Deep-Submicron MOSFETs

(2009) Zhiyuan Li et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Thermal Study of the High-Frequency Noise in GaN HEMTs

(2008) M. Thorsell et al.   IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES

A new small-signal modeling and extraction method in AlGaN/GaN HEMTs

(2007) Jing Lu et al.   SOLID-STATE ELECTRONICS