Modeling of Forward Gate Leakage Current in MOSHEMT Using Trap-Assisted Tunneling and Poole–Frenkel Emission

Published 2016 View Full Article

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Title
Modeling of Forward Gate Leakage Current in MOSHEMT Using Trap-Assisted Tunneling and Poole–Frenkel Emission
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 63, Issue 6, Pages 2346-2352
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2016-05-03
DOI
10.1109/ted.2016.2555851

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