Channel temperature measurement in hermetic packaged GaN HEMTs power switch using fast static and transient thermal methods

Evaluation of thermal performance of packaged GaN HEMT cascode power switch by transient thermal testing

(2016) Szu-Hao Chen et al.   APPLIED THERMAL ENGINEERING

Thermal diffusivity identification by 2nd derivative analysis of transient temperature profile

(2016) Damien Meresse et al.   JOURNAL OF THERMAL ANALYSIS AND CALORIMETRY

Performance characterization of gallium nitride HEMT cascode switch for power conditioning applications

(2015) Po-Chien Chou et al.   Materials Science and Engineering B-Advanced Functional Solid-State Materials

Performance characterization of gallium nitride HEMT cascode switch for power conditioning applications

(2015) Po-Chien Chou et al.   Materials Science and Engineering B-Advanced Functional Solid-State Materials

Evaluation of thermal performance of all-GaN power module in parallel operation

(2014) Po-Chien Chou et al.   APPLIED THERMAL ENGINEERING

Novel packaging design for high-power GaN-on-Si high electron mobility transistors (HEMTs)

(2012) Stone Cheng et al.   INTERNATIONAL JOURNAL OF THERMAL SCIENCES

Channel Temperature Measurement of AlGaN/GaN HEMTs by Forward Schottky Characteristics

(2011) Guang-Chen Zhang et al.   CHINESE PHYSICS LETTERS

Measurement of Channel Temperature in GaN High-Electron Mobility Transistors

(2009) Jungwoo Joh et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Dependence of GaN HEMT Millimeter-Wave Performance on Temperature

(2009) A.M. Darwish et al.   IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES

Physical degradation of GaN HEMT devices under high drain bias reliability testing

(2009) S.Y. Park et al.   MICROELECTRONICS RELIABILITY

Simulation of Life Testing Procedures for Estimating Long-Term Degradation and Lifetime of AlGaN/GaN HEMTs

(2008) E.R. Heller   IEEE TRANSACTIONS ON ELECTRON DEVICES

Utilizing Diode Characteristics for GaN HEMT Channel Temperature Prediction

(2008) A.M. Darwish et al.   IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES