Bias Stress Stability Improvement in Solution-Processed Low-Voltage Organic Field-Effect Transistors Using Relaxor Ferroelectric Polymer Gate Dielectric

Published 2017 View Full Article

Authors

Keywords

Journal

IEEE ELECTRON DEVICE LETTERS

Volume 38, Issue 6, Pages 748-751

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2017-06-08

DOI

10.1109/led.2017.2696987

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

IEEE ELECTRON DEVICE LETTERS

Ask authors/readers for more resources

Protocol

Reagent

Reprint

Find the ideal target journal for your manuscript

Create your own webinar