Bias Stress Stability Improvement in Solution-Processed Low-Voltage Organic Field-Effect Transistors Using Relaxor Ferroelectric Polymer Gate Dielectric

出版年份 2017 全文链接

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出版物

IEEE ELECTRON DEVICE LETTERS

Volume 38, Issue 6, Pages 748-751

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2017-06-08

DOI

10.1109/led.2017.2696987

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