Field Emission at Grain Boundaries: Modeling the Conductivity in Highly Doped Polycrystalline Semiconductors
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Title
Field Emission at Grain Boundaries: Modeling the Conductivity in Highly Doped Polycrystalline Semiconductors
Authors
Keywords
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Journal
Physical Review Applied
Volume 5, Issue 2, Pages -
Publisher
American Physical Society (APS)
Online
2016-02-23
DOI
10.1103/physrevapplied.5.024009
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