Band alignment of TiO2/FTO interface determined by X-ray photoelectron spectroscopy: Effect of annealing
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Title
Band alignment of TiO2/FTO interface determined by X-ray photoelectron spectroscopy: Effect of annealing
Authors
Keywords
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Journal
AIP Advances
Volume 6, Issue 1, Pages 015314
Publisher
AIP Publishing
Online
2016-01-27
DOI
10.1063/1.4941040
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