Band alignment of TiO2/FTO interface determined by X-ray photoelectron spectroscopy: Effect of annealing
出版年份 2016 全文链接
标题
Band alignment of TiO2/FTO interface determined by X-ray photoelectron spectroscopy: Effect of annealing
作者
关键词
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出版物
AIP Advances
Volume 6, Issue 1, Pages 015314
出版商
AIP Publishing
发表日期
2016-01-27
DOI
10.1063/1.4941040
参考文献
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