Surface Passivation for Reliable Measurement of Bulk Electronic Properties of Heterojunction Devices

Title
Surface Passivation for Reliable Measurement of Bulk Electronic Properties of Heterojunction Devices
Authors
Keywords
-
Journal
Small
Volume 12, Issue 38, Pages 5339-5346
Publisher
Wiley
Online
2016-08-04
DOI
10.1002/smll.201601575

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