Quartz tuning fork based microwave impedance microscopy

Scanning Probe Microwave Reflectivity of Aligned Single-Walled Carbon Nanotubes: Imaging of Electronic Structure and Quantum Behavior at the Nanoscale

(2015) Eric Seabron et al.   ACS Nano

Thermal Oxidation of WSe2 Nanosheets Adhered on SiO2/Si Substrates

(2015) Yingnan Liu et al.   NANO LETTERS

Mobile metallic domain walls in an all-in-all-out magnetic insulator

(2015) E. Y. Ma et al.   SCIENCE

Charge-order domain walls with enhanced conductivity in a layered manganite

(2015) Eric Yue Ma et al.   Nature Communications

Unexpected edge conduction in mercury telluride quantum wells under broken time-reversal symmetry

(2015) Eric Yue Ma et al.   Nature Communications

Shielded piezoresistive cantilever probes for nanoscale topography and electrical imaging

(2014) Yongliang Yang et al.   JOURNAL OF MICROMECHANICS AND MICROENGINEERING

Quantitative impedance characterization of sub-10 nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscope

(2014) Fei Wang et al.   NANOTECHNOLOGY

Unexpected surface implanted layer in static random access memory devices observed by microwave impedance microscope

(2013) W Kundhikanjana et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Batch-fabricated cantilever probes with electrical shielding for nanoscale dielectric and conductivity imaging

(2012) Yongliang Yang et al.   JOURNAL OF MICROMECHANICS AND MICROENGINEERING

Imaging of Coulomb-Driven Quantum Hall Edge States

(2011) Keji Lai et al.   PHYSICAL REVIEW LETTERS

Nanoscale microwave microscopy using shielded cantilever probes

(2011) Keji Lai et al.   Applied Nanoscience

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

(2010) H. P. Huber et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Mesoscopic Percolating Resistance Network in a Strained Manganite Thin Film

(2010) K. Lai et al.   SCIENCE

Tapping mode microwave impedance microscopy

(2009) K. Lai et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Calibration of shielded microwave probes using bulk dielectrics

(2008) K. Lai et al.   APPLIED PHYSICS LETTERS

Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement

(2008) A. Karbassi et al.   REVIEW OF SCIENTIFIC INSTRUMENTS