Quantitative impedance characterization of sub-10 nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscope
Published 2014 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Quantitative impedance characterization of sub-10 nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscope
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 25, Issue 40, Pages 405703
Publisher
IOP Publishing
Online
2014-09-12
DOI
10.1088/0957-4484/25/40/405703
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Calibrated complex impedance and permittivity measurements with scanning microwave microscopy
- (2014) G Gramse et al. NANOTECHNOLOGY
- Proximity Injection of Plasticizing Molecules to Self-Assembling Polymers for Large-Area, Ultrafast Nanopatterning in the Sub-10-nm Regime
- (2013) Jae Won Jeong et al. ACS Nano
- Scanning Near-Field Microwave Microscopy of VO2and Chemical Vapor Deposition Graphene
- (2013) Alexander Tselev et al. ADVANCED FUNCTIONAL MATERIALS
- Detecting response of microelectromechanical resonators by microwave reflectometry
- (2013) B. Legrand et al. APPLIED PHYSICS LETTERS
- Water Electrolysis and Energy Harvesting with Zero-Dimensional Ion-Sensitive Field-Effect Transistors
- (2013) N. Clément et al. NANO LETTERS
- Vertical nanowire array-based field effect transistors for ultimate scaling
- (2013) G. Larrieu et al. Nanoscale
- An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurements
- (2013) T. Dargent et al. REVIEW OF SCIENTIFIC INSTRUMENTS
- Nanoscale Transistors--Just Around the Gate?
- (2013) C. D. Cress et al. SCIENCE
- A nanoscale shape memory oxide
- (2013) Jinxing Zhang et al. Nature Communications
- Conductance Statistics from a Large Array of Sub-10 nm Molecular Junctions
- (2012) Kacem Smaali et al. ACS Nano
- Detecting signals buried in noise via nanowire transistors using stochastic resonance
- (2012) Katsuhiko Nishiguchi et al. APPLIED PHYSICS LETTERS
- Phase and amplitude sensitive scanning microwave microscopy/spectroscopy on metal–oxide–semiconductor systems
- (2012) I. Humer et al. JOURNAL OF APPLIED PHYSICS
- Calibrated nanoscale dopant profiling using a scanning microwave microscope
- (2012) H. P. Huber et al. JOURNAL OF APPLIED PHYSICS
- Role of Hydration on the Electronic Transport through Molecular Junctions on Silicon
- (2012) Nicolas Clément et al. Journal of Physical Chemistry C
- Sub-10 nm Carbon Nanotube Transistor
- (2012) Aaron D. Franklin et al. NANO LETTERS
- A III–V nanowire channel on silicon for high-performance vertical transistors
- (2012) Katsuhiro Tomioka et al. NATURE
- Ferroelectric order in individual nanometre-scale crystals
- (2012) Mark J. Polking et al. NATURE MATERIALS
- Evaluation of a Gate Capacitance in the Sub-aF Range for a Chemical Field-Effect Transistor With a Si Nanowire Channel
- (2011) Nicolas Clément et al. IEEE TRANSACTIONS ON NANOTECHNOLOGY
- Assembly of Sub-10-nm Block Copolymer Patterns with Mixed Morphology and Period Using Electron Irradiation and Solvent Annealing
- (2011) Jeong Gon Son et al. NANO LETTERS
- An integrated capacitance bridge for high-resolution, wide temperature range quantum capacitance measurements
- (2011) Arash Hazeghi et al. REVIEW OF SCIENTIFIC INSTRUMENTS
- Large Array of Sub-10-nm Single-Grain Au Nanodots for use in Nanotechnology
- (2011) Nicolas Clément et al. Small
- Gigahertz characterization of a single carbon nanotube
- (2010) L. Nougaret et al. APPLIED PHYSICS LETTERS
- Formation of Bandgap and Subbands in Graphene Nanomeshes with Sub-10 nm Ribbon Width Fabricated via Nanoimprint Lithography
- (2010) Xiaogan Liang et al. NANO LETTERS
- Direct imaging of conductivity in pentacene field-effect transistors by a near-field scanning microwave microprobe
- (2010) Arsen Babajanyan et al. ORGANIC ELECTRONICS
- Calibrated nanoscale capacitance measurements using a scanning microwave microscope
- (2010) H. P. Huber et al. REVIEW OF SCIENTIFIC INSTRUMENTS
- One-by-one trap activation in silicon nanowire transistors
- (2010) N. Clément et al. Nature Communications
- Nanogold: A Quantitative Phase Map
- (2009) Amanda S. Barnard et al. ACS Nano
- Attofarad resolution capacitance–voltage measurement of nanometer scale field effect transistors utilizing ambient noise
- (2009) Ali Gokirmak et al. NANOTECHNOLOGY
- Tapping mode microwave impedance microscopy
- (2009) K. Lai et al. REVIEW OF SCIENTIFIC INSTRUMENTS
- Sub-10 nm Nanoimprint Lithography by Wafer Bowing
- (2008) Wei Wu et al. NANO LETTERS
- Modeling and characterization of a cantilever-based near-field scanning microwave impedance microscope
- (2008) K. Lai et al. REVIEW OF SCIENTIFIC INSTRUMENTS
- Chemically Derived, Ultrasmooth Graphene Nanoribbon Semiconductors
- (2008) X. Li et al. SCIENCE
Publish scientific posters with Peeref
Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.
Learn MoreAsk a Question. Answer a Question.
Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.
Get Started