标题
Quartz tuning fork based microwave impedance microscopy
作者
关键词
-
出版物
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 87, Issue 6, Pages 063711
出版商
AIP Publishing
发表日期
2016-06-29
DOI
10.1063/1.4954156
参考文献
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- (2008) A. Karbassi et al. REVIEW OF SCIENTIFIC INSTRUMENTS
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