Temperature-dependent bias-stress-induced electrical instability of amorphous indium-gallium-zinc-oxide thin-film transistors

Published 2015 View Full Article

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Title
Temperature-dependent bias-stress-induced electrical instability of amorphous indium-gallium-zinc-oxide thin-film transistors
Authors
Keywords
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Journal
Chinese Physics B
Volume 24, Issue 7, Pages 077307
Publisher
IOP Publishing
Online
2015-06-25
DOI
10.1088/1674-1056/24/7/077307

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