The butterfly – a well-defined constant-current topography pattern on Si(001):H and Ge(001):H resulting from current-induced defect fluctuations
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Title
The butterfly – a well-defined constant-current topography pattern on Si(001):H and Ge(001):H resulting from current-induced defect fluctuations
Authors
Keywords
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Journal
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
Volume 18, Issue 28, Pages 19309-19317
Publisher
Royal Society of Chemistry (RSC)
Online
2016-06-23
DOI
10.1039/c6cp04031d
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