A study of the interfacial resistive switching mechanism by proton exchange reactions on the SiOx layer
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Title
A study of the interfacial resistive switching mechanism by proton exchange reactions on the SiOx layer
Authors
Keywords
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Journal
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
Volume 18, Issue 2, Pages 700-703
Publisher
Royal Society of Chemistry (RSC)
Online
2015-11-25
DOI
10.1039/c5cp06507k
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