Mobile ions entering the IGBT gate oxide - electrical detection and failure localization by lock-in thermography

出版年份 2023 全文链接

标题

Mobile ions entering the IGBT gate oxide - electrical detection and failure localization by lock-in thermography

作者

关键词

-

出版物

MICROELECTRONICS RELIABILITY

Volume 150, Issue -, Pages 115064

出版商

Elsevier BV

发表日期

2023-10-02

DOI

10.1016/j.microrel.2023.115064

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