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Removal of FIB Damage using Flash Electropolishing for Artifact-free TEM Foils

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Deep Learning Based Atom Segmentation and Noise and Missing-Wedge Reduction for Electron Tomography

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Microstructural evolution of CANDU spacer material Inconel X-750 under in situ ion irradiation

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The swelling, microstructure, and hardening of wrought LCAC, TZM, and ODS molybdenum following neutron irradiation

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