Machine Learning Pipeline for Segmentation and Defect Identification from High-Resolution Transmission Electron Microscopy Data

Title
Machine Learning Pipeline for Segmentation and Defect Identification from High-Resolution Transmission Electron Microscopy Data
Authors
Keywords
-
Journal
MICROSCOPY AND MICROANALYSIS
Volume -, Issue -, Pages 1-8
Publisher
Cambridge University Press (CUP)
Online
2021-05-06
DOI
10.1017/s1431927621000386

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