Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling

Title
Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling
Authors
Keywords
-
Journal
ADVANCED MATERIALS
Volume 27, Issue 19, Pages 3002-3006
Publisher
Wiley
Online
2015-04-09
DOI
10.1002/adma.201500527

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