Making DeepFakes More Spurious: Evading Deep Face Forgery Detection via Trace Removal Attack

Published 2023 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Making DeepFakes More Spurious: Evading Deep Face Forgery Detection via Trace Removal Attack
Authors
Keywords
-
Journal
IEEE Transactions on Dependable and Secure Computing
Volume -, Issue -, Pages 1-15
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2023-02-03
DOI
10.1109/tdsc.2023.3241604

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.