Making DeepFakes More Spurious: Evading Deep Face Forgery Detection via Trace Removal Attack

出版年份 2023 全文链接

标题

作者

关键词

出版物

Volume -, Issue -, Pages 1-15

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2023-02-03

DOI

10.1109/tdsc.2023.3241604

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