Evaluation of neon focused ion beam milling for TEM sample preparation

Published 2016 View Full Article

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Title
Evaluation of neon focused ion beam milling for TEM sample preparation
Authors
Keywords
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Journal
JOURNAL OF MICROSCOPY
Volume 264, Issue 1, Pages 59-63
Publisher
Wiley
Online
2016-05-12
DOI
10.1111/jmi.12416
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