The application of focused ion beam microscopy in the material sciences

Published 2008 View Full Article

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Title
The application of focused ion beam microscopy in the material sciences
Authors
Keywords
-
Journal
MATERIALS CHARACTERIZATION
Volume 60, Issue 1, Pages 2-13
Publisher
Elsevier BV
Online
2008-12-06
DOI
10.1016/j.matchar.2008.11.014

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