Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in CuMoS by an advanced electrochemical strain microscopy method
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Title
Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in CuMoS by an advanced electrochemical strain microscopy method
Authors
Keywords
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Journal
Scientific Reports
Volume 11, Issue 1, Pages -
Publisher
Springer Science and Business Media LLC
Online
2021-09-13
DOI
10.1038/s41598-021-96602-2
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