Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy

Title
Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 27, Issue 42, Pages 425707
Publisher
IOP Publishing
Online
2016-09-16
DOI
10.1088/0957-4484/27/42/425707

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