Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopy

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Title
Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopy
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 28, Issue 6, Pages 065704
Publisher
IOP Publishing
Online
2016-12-14
DOI
10.1088/1361-6528/aa5370

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