Learning-based defect recognition for quasi-periodic HRSTEM images

Title
Learning-based defect recognition for quasi-periodic HRSTEM images
Authors
Keywords
High-resolution scanning transmission electron microscopy, III–V/Si materials, Machine learning, Computer vision, Crystalline defects recognition
Journal
MICRON
Volume 146, Issue -, Pages 103069
Publisher
Elsevier BV
Online
2021-05-04
DOI
10.1016/j.micron.2021.103069

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