StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images

Published 2016 View Full Article

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Title
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
Authors
Keywords
High-resolution (scanning) transmission electron microscopy (HR (S)TEM), Dataprocessing/image processing, Quantitative electron microscopy, General methods in microscopy, Statistical parameter estimation theory, Tools, Model-based fitting
Journal
ULTRAMICROSCOPY
Volume 171, Issue -, Pages 104-116
Publisher
Elsevier BV
Online
2016-09-10
DOI
10.1016/j.ultramic.2016.08.018

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