Correlative Super-Resolution and Atomic Force Microscopy of DNA Nanostructures and Characterization of Addressable Site Defects

Title
Correlative Super-Resolution and Atomic Force Microscopy of DNA Nanostructures and Characterization of Addressable Site Defects
Authors
Keywords
-
Journal
ACS Nano
Volume 15, Issue 7, Pages 11597-11606
Publisher
American Chemical Society (ACS)
Online
2021-06-17
DOI
10.1021/acsnano.1c01976

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started