Valley relaxation of resident electrons and holes in a monolayer semiconductor: Dependence on carrier density and the role of substrate-induced disorder
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Title
Valley relaxation of resident electrons and holes in a monolayer semiconductor: Dependence on carrier density and the role of substrate-induced disorder
Authors
Keywords
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Journal
Physical Review Materials
Volume 5, Issue 4, Pages -
Publisher
American Physical Society (APS)
Online
2021-04-05
DOI
10.1103/physrevmaterials.5.044001
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