Correction of artefacts associated with large area EBSD

Title
Correction of artefacts associated with large area EBSD
Authors
Keywords
Serial block face sectioning electron microscopy (SBFSEM), Broad ion beam polishing, electron back scatter diffraction, focused ion beam (FIB), Computed tomography (CT), Cermet
Journal
ULTRAMICROSCOPY
Volume -, Issue -, Pages 113315
Publisher
Elsevier BV
Online
2021-05-14
DOI
10.1016/j.ultramic.2021.113315

Ask authors/readers for more resources

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search